NRCS
NOTICE OF REGISTRATION CONFIRMATION EMAILED
07/21/2026
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Official data from USPTO
CRYOTEMP
Did you know this trademark is already registered in United States?
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Active USPTO registrationType: WordOffice: US
Risk and opportunity diagnosis
Executive reading for naming, filing, and monitoring decisions.
USPTO status
Active USPTO registration
Case type
Application and registration
Recorded events
24
Latest update
07/21/2026
Classification
Registered
Trademark type
Word
Nice classes
9
Filing date
06/20/2025
Registration date
07/21/2026
Expiration date
-
Recommended action
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Next step
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Complete case details
Structured fields from the responsible authority and the official record.
Status date
07/21/2026
Last transaction
07/21/2026
Responsible office
United States Patent and Trademark Office
Status code
700
Official register
Supplemental Register
Filing basis
Foreign priority
First use anywhere
12/31/2023
First use in commerce
12/31/2023
Drawing code
4
Owner type
03
Owner location
Milpitas, CA, US
Examiner
ROTH, BENJAMIN H.
Law office
N40
Current location
FILE REPOSITORY (FRANCONIA)
Holders and representatives
Holders
K. C. (pessoa física)
Representatives
Paul A. Rodriguez Dickinson Wright PLLC
Technical classification
Nice Classes
Class 9
Vienna Codes
No Vienna codes available.
Goods and services
Class 9
Apparatus and instruments for physicsin-situ semiconductor process temperature measurement wafers equipped with embedded electronic temperature sensors for monitoring wafer level thermal profiles inside semiconductor process chambersparticularly plasma etch chambers; Diagnostic equipment for research laboratory usetemperature sensing wafers for measuring wafer temperature and environmental conditions during cryogenic plasma etch processes; Measures for measuring temperature distribution and thermal profiles within etch chambers; Computer softwarerecordedfor controllingcollectinganalyzingdisplaying cryogenic wafer temperature measurement data; Computer software applicationsdownloadablefor controllingcollectinganalyzingdisplaying cryogenic wafer temperature measurement data
Publications
History of USPTO decisions and trademark events.
24 publications found
R.SR
REGISTERED-SUPPLEMENTAL REGISTER
07/21/2026
ERRR
ON HOLD - ELECTRONIC RECORD REVIEW REQUIRED
06/19/2026
CNTA
APPROVED FOR REGISTRATION SUPPLEMENTAL REGISTER
06/09/2026
GNEN
NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED
06/09/2026
XAEC
EXAMINER'S AMENDMENT ENTERED
06/09/2026
GNEA
EXAMINERS AMENDMENT E-MAILED
06/09/2026
CNEA
EXAMINERS AMENDMENT -WRITTEN
06/09/2026
TEME
TEAS/EMAIL CORRESPONDENCE ENTERED
05/12/2026
CRFA
CORRESPONDENCE RECEIVED IN LAW OFFICE
05/12/2026
TROA
TEAS RESPONSE TO OFFICE ACTION RECEIVED
05/12/2026
GNRN
NOTIFICATION OF NON-FINAL ACTION E-MAILED
02/12/2026
GNRT
NON-FINAL ACTION E-MAILED
02/12/2026
CNRT
NON-FINAL ACTION WRITTEN
02/12/2026
TEME
TEAS/EMAIL CORRESPONDENCE ENTERED
01/26/2026
CRFA
CORRESPONDENCE RECEIVED IN LAW OFFICE
01/26/2026
TROA
TEAS RESPONSE TO OFFICE ACTION RECEIVED
01/26/2026
GNRN
NOTIFICATION OF NON-FINAL ACTION E-MAILED
11/18/2025
GNRT
NON-FINAL ACTION E-MAILED
11/18/2025
CNRT
NON-FINAL ACTION WRITTEN
11/18/2025
DOCK
ASSIGNED TO EXAMINER
11/07/2025
NWOS
NEW APPLICATION OFFICE SUPPLIED DATA ENTERED
10/28/2025
MAFR
APPLICATION FILING RECEIPT MAILED
06/20/2025
NWAP
NEW APPLICATION ENTERED
06/20/2025
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