REM3
COURTESY REMINDER - SEC. 71 (6-YR) E-MAILED
09/22/2025
Back to search
Official data from USPTO
PIXIRAD
Did you know this trademark is already registered in United States?
Before investing in name, identity, and promotion, validate collision risk and registration strategy to avoid wasting time and budget.
Active USPTO registrationType: WordOffice: US
Risk and opportunity diagnosis
Executive reading for naming, filing, and monitoring decisions.
USPTO status
Active USPTO registration
Case type
Application and registration
Recorded events
23
Latest update
09/23/2025
Classification
Registered
Trademark type
Word
Nice classes
9
Filing date
09/30/2019
Registration date
09/22/2020
Expiration date
-
Recommended action
Perform a full collision analysis and validate classes before any filing or trademark investment.
Next step
These are the details of the registration process. Even so, constant monitoring is what ensures peace of mind that your main asset remains protected.
Complete case details
Structured fields from the responsible authority and the official record.
Status date
09/22/2020
Last transaction
09/23/2025
Responsible office
United States Patent and Trademark Office
Status code
700
Official register
Principal Register
Drawing code
4
Owner type
99
Owner location
NL
Examiner
KUMIS,SCOTT N
Law office
N70
Current location
PUBLICATION AND ISSUE SECTION
Holders and representatives
Holders
Malvern Panalytical B.V.
Representatives
Matthew A. Homyk Blank Rome LLP
Technical classification
Nice Classes
Class 9
Vienna Codes
No Vienna codes available.
Goods and services
Class 9
Scientificmeasuring and detecting apparatus and instrumentsspectrometersX-ray fluorescence analysers and spectrometersdiffractometersX-ray diffractometers and wafer analysersneutron activation analyserspulsed fast and thermal neutron activation analysers; X-ray detecting apparatus and instruments; X-ray measuringdetecting and monitoring instrumentsindicators and controllers not for medical purposes; X-ray detectors not for medical purposes; analytical apparatus for use in analysing samples of composites for use in scientificindustrial and laboratory applicationsX-ray diffraction and spectrometry apparatusdiffractometersX-ray diffractometersX-ray analysersX-ray fluorescence spectrometerswafer analysersX-ray tubes; materials characterization apparatus in the nature of scientific and measuring apparatus and instrumentsspectrometersX-ray fluorescence analysers and spectrometersdiffractometersX-ray diffractometers and wafer analysers; X-ray apparatus not for medical use; analyticalprocess control and measuring apparatusreflectometersspectrometersX-ray fluorescence analysers and X-ray diffraction meters; analyticalprocess control and measuring apparatusreflectometersspectrometersX-ray fluorescence analysers and X-ray diffraction meters for the cementsteelaluminiumpetrochemicalsindustrial mineralsglass and polymers industryto customers in research and development institutions; metrology toolsreflectometersspectrometersX-ray fluorescence analysers and X-ray diffraction meters; reflectometersspectrometersX-ray fluorescence analysers and X-ray diffraction meters for both silicon and compound semiconductor applications; X-ray fluorescence wafer and disc analysersautomated ellipsometers; X-ray fluorescence wafer and disc analysers and automated ellipsometers for the silicon semiconductor industryfor analysing film thicknesscomposition and density; diffraction apparatus for microscopy; diffraction apparatus and instruments; X-ray diffraction instrumentsincluding X-ray diffraction meters for the compound semiconductor industry; X-ray tubesnot for medical purposes; downloadable or recorded computer software for use in relation to spectrometry; downloadable or recorded computer software for analysis purposes; downloadable or recorded computer software for use in relation to diffractometry; downloadable or recorded computer software for use in relation to X-ray fluorescence analysis; downloadable or recorded computer software for use in relation to the determination of X-ray intensities; downloadable or recorded computer software for use in relation to X-ray diffraction analysis for use with x-ray apparatus not for medical use; component parts and fittings for all the aforesaid goods
Publications
History of USPTO decisions and trademark events.
23 publications found
NREP
NEW REPRESENTATIVE AT IB RECEIVED
05/16/2025
FINO
FINAL DECISION TRANSACTION PROCESSED BY IB
01/23/2021
FICS
FINAL DISPOSITION NOTICE SENT TO IB
01/06/2021
FIMP
FINAL DISPOSITION PROCESSED
01/06/2021
FICR
FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB
12/22/2020
R.PR
REGISTERED-PRINCIPAL REGISTER
09/22/2020
NPUB
OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
07/07/2020
PUBO
PUBLISHED FOR OPPOSITION
07/07/2020
NONP
NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED
06/17/2020
CNSA
APPROVED FOR PUB - PRINCIPAL REGISTER
06/03/2020
TEME
TEAS/EMAIL CORRESPONDENCE ENTERED
05/04/2020
CRFA
CORRESPONDENCE RECEIVED IN LAW OFFICE
05/04/2020
TROA
TEAS RESPONSE TO OFFICE ACTION RECEIVED
05/04/2020
RFNT
REFUSAL PROCESSED BY IB
02/15/2020
RFCS
NON-FINAL ACTION MAILED - REFUSAL SENT TO IB
01/27/2020
RFRR
REFUSAL PROCESSED BY MPU
01/27/2020
RFCR
NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW
01/03/2020
CNRT
NON-FINAL ACTION WRITTEN
01/02/2020
DOCK
ASSIGNED TO EXAMINER
01/02/2020
MAFR
APPLICATION FILING RECEIPT MAILED
12/10/2019
NWOS
NEW APPLICATION OFFICE SUPPLIED DATA ENTERED
12/06/2019
REPR
SN ASSIGNED FOR SECT 66A APPL FROM IB
12/05/2019
Continuous trademark protection
Get notified about every new filing that threatens PIXIRAD or your mark.
Professional 24-month watch service: we monitor USPTO for you and alert you in time to oppose — before conflicts become losses.