NREP
NEW REPRESENTATIVE AT IB RECEIVED
06/11/2020
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Official data from USPTO
EVG
Did you know this trademark is already registered in United States?
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Active USPTO registrationType: CombinedOffice: US
Risk and opportunity diagnosis
Executive reading for naming, filing, and monitoring decisions.
USPTO status
Active USPTO registration
Case type
Application and registration
Recorded events
54
Latest update
06/11/2020
Classification
Registered
Trademark type
Combined
Nice classes
7, 9, 10, 42
Filing date
08/13/2007
Registration date
04/28/2009
Expiration date
-
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Next step
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Complete case details
Structured fields from the responsible authority and the official record.
Status date
04/18/2019
Last transaction
04/18/2019
Responsible office
United States Patent and Trademark Office
Status code
706
Official register
Principal Register
Drawing code
3
Owner type
16
Owner location
St. Florian am Inn, AT
Examiner
FRENCH, CURTIS W
Law office
M60
Current location
GENERIC WEB UPDATE
Mark description
The mark consists of the color dark grey appearing in the wording "EVG" and in the design in the middle of the ellipse. The color yellow fills in the ellipse around the design element.
Holders and representatives
Holders
EV GROUP E. THALLNER GmbH
EV GROUP E. THALLNER GmbH
Representatives
Patricia A. Walker Walker & Jocke Co., LPA
Technical classification
Nice Classes
Class 7Class 9Class 10Class 42
Vienna Codes
No Vienna codes available.
Goods and services
Class 7
Machines and structural parts thereforefor the productiontreatmenttransport and processing of electronic componentssemiconductorsin the field of microelectronicmedical technologybiotechnologysemiconductor technology and microsystems technology; machines and structural parts thereforfor the productiontreatment and processing of semiconductors; machines and structural parts therefore for treatment of surfaces of electronic componentsespecially wafers
Class 9
Scientific apparatus and instruments for microelectronicsbiotechnologymicrosystem techniquessemiconductor and nanotechnologyexposure systems for 1X lithography applicationsmask aligners and contact and proximity printers and devices for joining one or multiple substrates temporarily or permanentlysubstrate bonding systems comprised of UV-radiation/UV-light source devicesheaterspneumatic and hydraulic piston setups and spindles; systems for the application of coatings to work piecesresist coatersdeveloper systems for developing lithographically structured layersresist developersimprinting systems used to imprint pattern onto surfaces on work piecesimprint lithography systems comprised of one or more of the following componentsalignment stages for substrate to stamp alignment suitable for a single step or step and repeat alignmentmeans to apply imprinting forcemeans to cure the imprint resist such as a UV- light source and heatersmeasurement apparatus that can detect the relative position of the stamp versus the substrate and provide the input for the alignment procedure; lamination equipment used to coat surfaces with tape like materials; surveying instruments; electricphotographicopticalmeasuringsignalmonitoring devicesprecision systems in the semiconductor technologyin microelectronicsin medical equipment techniquesbiotechnologymicrosystem techniquesnanotechnologyfront to backside alignment accuracy measurement systems comprised of one or more of the following: measurement apparatus that detects a reference pattern on both the front and on the backside of a substrate and stages that allow for moving the substrate so that the measurement apparatus can detect the pattern at the desired location of the substrateas well as computer hardware that can analyze the data and calculate misalignment values between the pattern on the front and on the backside; infrared microscopesmetrology systems comprised of one or more of the followinginfrared light source devices for infrared inspection of the bonding interfaceinfrared detectors to detect the infrared light passing through the bond interfaceultrasonic transducers and detectorsx-ray transducers and detectorsvisible light light-sources and camerasmicroscope setupscomputer hardware and operating software for data analysis for the inspection of wafer bonding interfaces; overlay accuracy measurement systems comprised of optical detection devicesmicroscopes and lasers to detect the positions of two patterns in reference to each othercomputer hardware for data analysis and collectionas well as mapping; critical dimension metrology systems comprised of optical detection devicesmicroscopes and lasers to detect the two or more features of a specific pattern on the wafer and allow for calculation of the distance between themas well as a computer hardware for data analysiscollection and mapping; pressure uniformity metrology apparatus; apparatus for analysisfront to backside alignment accuracy measurement system comprised of one or more of the following: measurement apparatus that detects a reference pattern on both the front and on the backside of a substrate and stages that allow for moving the substrate so that the measurement apparatus can detect the pattern at the desired location of the substrateas well as computer hardware and software that can analyze the data and calculate misalignment values between the pattern on the front and on the backside; semiconductor chipsintegrated circuits; computer operation programs; peripheral equipment for computers; data processing unitsdata processors and computer hardware; computer software related to the analysis of lithography resultssoftware for the analysis of wafer bonding resultsaligning software; scientific diagnosis devices in bio-chip formatoligonucleotide-arraysminiaturized immunologic test-arrayssubstance librariescombinatorial substance libraries on chip surfaces for scientific purposes; remote controls for electric systems for remote controlled industrial operational processeslaboratory robots; electric control panels for manufacturing facilities for microelectronicsmedical equipment techniquesbiotechnologymicrosystem techniquesnanotechnology; filters and masks for photographic and photolithographic equipment; telescopes; telephones; semiconductors; monitoring devicesoscillographsindicatorssurveying instruments; data processing coupler; special furniture for laboratories; laser for non-medical purposes; reading devices for processing electronic data; measuring instruments and measuring deviceslaser measuring devices; material testing instruments and machinesmachines for testing bonding strength in bonded substratesfront to backside alignment accuracy measurement systems comprised of one or more of the following: measurement apparatus that detect a reference pattern on both the front and on the backside of a substrate and stages that allow for moving the substrate so that the measurement apparatus can detect the pattern at the desired location of the substrateas well as computer hardware and related software that can analyze the data and calculate misalignment values between the pattern on the front and on the backside; infrared microscopesmetrology systems comprised of one or more of the following; infrared light source devices for infrared inspection of the bonding interfaceinfrared detectors to detect the infrared light passing through the bond interfaceultrasonic transducers and detectorsx-ray transducers and detectorsvisible light light-sources and camerasmicroscope setupscomputer hardware and related software for data analysis for the inspection of wafer bonding interfaces; optical apparatus and instrumentsmicroscopes; photographic apparatus and instrumentscameras; video projectors; controlled volume pumps; protective clothingin particular for clean-rooms; silicon wafers; probes for scientific purposes; spectroscopes; photographic range finders
Class 10
Medical diagnosis devices in bio-chip formatoligonucleotide-arraysminiaturized immunologic test-arrayssubstance libraries for medical purposescombinatorial substance libraries on chip surfaces for medical purposes ; medical diagnostic devicesmicro-titer plates and nano-titer plates; analyzers for medical purposesmachines used to carry out automatic testing of biological samples; bio-array chips for being used as diagnosis means for bio-chemical applicationsfor tissue and secretory testsas well as for indication of physiologic parameters or of genetic informationfor screening in the pharmaceutical industry for developing drugsfor process monitoring with biotechnological processes; miniaturized sensors for use in gene analysis and diagnosis; medical devicesaccessories for bio-chips for filling and manipulating the same by machine as well as manuallychip-holderschip reader devicesas well as electronicfluidalmechanic control therefor
Class 42
Engineering services; development of precision systems and devices for the semiconductor technology; development of devices for microsystem techniquesmicroelectronicsmedical techniquesbiotechnology and telecommunication for others; consulting in the fields of medical and scientific equipment; research services in the field of microsystem technology and nanotechnology; research services in the field of bio-sensorics and chemical sensorics; technical consulting for third parties concerning handling production plants and process equipment; providing temporary use of non-downloadable software for data processing; designing of computer software for others
Publications
History of USPTO decisions and trademark events.
54 publications found
INNP
PARTIAL INVALIDATION PROCESSED BY THE IB
02/28/2020
INPS
PARTIAL INVALIDATION OF REG EXT PROTECTION SENT TO IB
01/16/2020
INPC
INVALIDATION PROCESSED
01/16/2020
INPR
PARTIAL INVALIDATION OF REG EXT PROTECTION CREATED
12/18/2019
NA71
NOTICE OF ACCEPTANCE OF SEC. 71 - E-MAILED
04/18/2019
71AG
REGISTERED-SEC.71 ACCEPTED
04/18/2019
APRE
CASE ASSIGNED TO POST REGISTRATION PARALEGAL
04/16/2019
71AF
REGISTERED-SEC.71 FILED
03/28/2019
REM4
COURTESY REMINDER - SEC. 71 (10-YR) E-MAILED
04/28/2018
RNWL
INTERNATIONAL REGISTRATION RENEWED
08/31/2017
NA75
NOTICE OF ACCEPTANCE OF SEC. 71 & 15 - E-MAILED
05/16/2014
C75A
REGISTERED - SEC. 71 ACCEPTED & SEC. 15 ACK.
05/16/2014
APRE
CASE ASSIGNED TO POST REGISTRATION PARALEGAL
05/16/2014
715F
REGISTERED - SEC. 71 & SEC. 15 FILED
04/29/2014
ES75
TEAS SECTION 71 & 15 RECEIVED
04/29/2014
FINO
FINAL DECISION TRANSACTION PROCESSED BY IB
01/12/2013
FICS
FINAL DISPOSITION NOTICE SENT TO IB
08/07/2009
FIMP
FINAL DISPOSITION PROCESSED
08/07/2009
FICR
FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB
07/28/2009
ADCH
CHANGE OF NAME/ADDRESS REC'D FROM IB
06/11/2009
OPNX
NOTIFICATION OF POSSIBLE OPPOSITION - PROCESSED BY IB
05/07/2009
R.PR
REGISTERED-PRINCIPAL REGISTER
04/28/2009
OPNS
NOTIFICATION OF POSSIBLE OPPOSITION SENT TO IB
04/23/2009
OPNR
NOTIFICATION OF POSSIBLE OPPOSITION CREATED, TO BE SENT TO IB
04/23/2009
PUBO
PUBLISHED FOR OPPOSITION
02/10/2009
NPUB
NOTICE OF PUBLICATION
01/21/2009
PREV
LAW OFFICE PUBLICATION REVIEW COMPLETED
01/06/2009
CNSA
APPROVED FOR PUB - PRINCIPAL REGISTER
01/05/2009
TEME
TEAS/EMAIL CORRESPONDENCE ENTERED
12/16/2008
CRFA
CORRESPONDENCE RECEIVED IN LAW OFFICE
12/15/2008
TROA
TEAS RESPONSE TO OFFICE ACTION RECEIVED
12/15/2008
GNRN
NOTIFICATION OF NON-FINAL ACTION E-MAILED
07/30/2008
GNRT
NON-FINAL ACTION E-MAILED
07/30/2008
CNRT
NON-FINAL ACTION WRITTEN
07/30/2008
TEME
TEAS/EMAIL CORRESPONDENCE ENTERED
06/26/2008
ALIE
ASSIGNED TO LIE
06/26/2008
CRFA
CORRESPONDENCE RECEIVED IN LAW OFFICE
06/25/2008
TROA
TEAS RESPONSE TO OFFICE ACTION RECEIVED
06/25/2008
GNRN
NOTIFICATION OF NON-FINAL ACTION E-MAILED
04/29/2008
GNRT
NON-FINAL ACTION E-MAILED
04/29/2008
CNRT
NON-FINAL ACTION WRITTEN
04/29/2008
TEME
TEAS/EMAIL CORRESPONDENCE ENTERED
03/29/2008
TCCA
TEAS CHANGE OF CORRESPONDENCE RECEIVED
03/28/2008
CRFA
CORRESPONDENCE RECEIVED IN LAW OFFICE
03/28/2008
TROA
TEAS RESPONSE TO OFFICE ACTION RECEIVED
03/28/2008
RFNT
REFUSAL PROCESSED BY IB
12/21/2007
RFCS
NON-FINAL ACTION MAILED - REFUSAL SENT TO IB
12/04/2007
RFRR
REFUSAL PROCESSED BY MPU
12/04/2007
RFCR
NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW
12/04/2007
CNRT
NON-FINAL ACTION WRITTEN
12/03/2007
DOCK
ASSIGNED TO EXAMINER
11/26/2007
NWAP
NEW APPLICATION ENTERED
11/26/2007
REPR
SN ASSIGNED FOR SECT 66A APPL FROM IB
11/22/2007
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