NRCC
NOTICE OF REGISTRATION CONFIRMATION EMAILED
07/21/2026
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Official data from USPTO
ALLRING
Did you know this trademark is already registered in United States?
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Active USPTO registrationType: CombinedOffice: United States
Risk and opportunity diagnosis
Executive reading for naming, filing, and monitoring decisions.
USPTO status
Active USPTO registration
Case type
Application and registration
Recorded events
16
Latest update
07/21/2026
Trademark type
Combined
Nice classes
7, 9
Filing date
12/18/2025
Registration date
07/21/2026
Expiration date
-
Complete case details
Structured fields from the responsible authority and the official record.
Status date
07/21/2026
Last transaction
07/21/2026
Responsible office
United States Patent and Trademark Office
Status code
700
Official register
Principal Register
First use anywhere
10/07/2025
First use in commerce
10/07/2025
Drawing code
3
Owner type
99
Owner location
Kaohsiung City, TW
Examiner
NOLASCO-ARIAS, KENNETH E
Law office
M70
Current location
FILE REPOSITORY (FRANCONIA)
Mark description
The mark consists of the word "ALLRING" in stylized font with a six-sided star design forming the dot of the letter "I".
Holders and representatives
Holders
ALL RING TECH. CO., LTD.
Representatives
Nicole B. Rackiewicz Rosenberg, Klein & Lee
Technical classification
Nice Classes
Class 7Class 9
Vienna Codes
No Vienna codes available.
Goods and services
Class 7
Cutting machines; Fluid dispensing machines for industrial use; Semiconductor manufacturing machines and semiconductor machinery for the manufacturing of semiconductors; Packaging equipment for semiconductor manufacturing; Semiconductor wafer processing machines; Condensed circuitry fabrication machines; Handling apparatus for loading and unloading; Semiconductor substrate transport device; Electronic component manufacturing equipment; Heat sink attach machine for semiconductor manufacturing
Class 9
Semiconductor inspection and testing equipmentsemiconductor wafers; Semiconductor testing machines; Semiconductor inspection equipment; Optical inspection device for semiconductor; Optical inspection apparatus for inspecting the appearance of semiconductor wafers; Inspection machines for the optical inspection of semiconductor wafers; Inspection machines for the optical inspection of the appearance of semiconductor wafers; Auto IC circuit detector; Optical inspection apparatus for inspecting the appearance of substrates of semiconductor; Automatic optical detector for use on semiconductors; Recorded software for controlling the industrial processes in the manufacturing of semiconductors; Optical coupling equipmentoptical coupler for semiconductor manufacturing
Publications
History of USPTO decisions and trademark events.
16 publications found
R.PR
REGISTERED-PRINCIPAL REGISTER
07/21/2026
NPUB
OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
06/02/2026
PUBO
PUBLISHED FOR OPPOSITION
06/02/2026
NONP
NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED
05/27/2026
PBCR
WITHDRAWN FROM PUB - OG REVIEW QUERY
05/12/2026
CNSA
APPROVED FOR PUB - PRINCIPAL REGISTER
04/23/2026
XAEC
EXAMINER'S AMENDMENT ENTERED
04/23/2026
GNEN
NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED
04/23/2026
GNEA
EXAMINERS AMENDMENT E-MAILED
04/23/2026
CNEA
EXAMINERS AMENDMENT -WRITTEN
04/23/2026
DOCK
ASSIGNED TO EXAMINER
04/22/2026
MDSC
NOTICE OF DESIGN SEARCH CODE E-MAILED
04/09/2026
NWOS
NEW APPLICATION OFFICE SUPPLIED DATA ENTERED
04/09/2026
MAFR
APPLICATION FILING RECEIPT MAILED
12/18/2025
NWAP
NEW APPLICATION ENTERED
12/18/2025
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