NRCC
NOTICE OF REGISTRATION CONFIRMATION EMAILED
02/24/2026
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Official data from USPTO
OSTINATO
Did you know this trademark is already registered in United States?
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Active USPTO registrationType: CombinedOffice: US
Risk and opportunity diagnosis
Executive reading for naming, filing, and monitoring decisions.
USPTO status
Active USPTO registration
Case type
Application and registration
Recorded events
21
Latest update
02/25/2026
Classification
Registered
Trademark type
Combined
Nice classes
9
Filing date
07/18/2023
Registration date
02/24/2026
Expiration date
-
Recommended action
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Next step
These are the details of the registration process. Even so, constant monitoring is what ensures peace of mind that your main asset remains protected.
Complete case details
Structured fields from the responsible authority and the official record.
Status date
02/24/2026
Last transaction
02/25/2026
Responsible office
United States Patent and Trademark Office
Status code
700
Official register
Principal Register
Filing basis
Intent to use
First use anywhere
09/20/2023
First use in commerce
03/01/2024
Drawing code
3
Owner type
03
Owner location
Gwangju-si,Gyeonggi-do, KR
Examiner
FLEBBE, KEVIN ROBERT
Law office
M10
Current location
PUBLICATION AND ISSUE SECTION
Mark description
The mark consists of the stylized wording "OSTINATO", with the first letter "O" represented by a circle. The crossbar of the letter "A" is broken.
Holders and representatives
Holders
SEMICS INC.
Representatives
Adriano Pacifici INTELLECTUAL PROPERTY CONSULTING, LLC
Technical classification
Nice Classes
Class 9
Vienna Codes
No Vienna codes available.
Goods and services
Class 9
Semiconductor wafer inspection apparatusinspection machines for electrical or optical inspection of semiconductor wafers; Apparatus for inspectionelectrical or optical inspection apparatus for semiconductor materialssemiconductor waferssemiconductor devices and semiconductor die; Semiconductor wafer probing apparatus; Semiconductor chip probing apparatus; Downloadable computer software for use in inspecting semiconductor wafers; Recorded computer software for use in inspecting semiconductor wafers; Downloadable computer software for use in testing and inspecting semiconductor materialssemiconductor waferssemiconductor devices and semiconductor die; Recorded computer software for use in testing and inspecting semiconductor materialssemiconductor waferssemiconductor devices and semiconductor die
Publications
History of USPTO decisions and trademark events.
21 publications found
R.PR
REGISTERED-PRINCIPAL REGISTER
02/24/2026
SUNA
NOTICE OF ACCEPTANCE OF STATEMENT OF USE E-MAILED
02/03/2026
CNPR
ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED
02/03/2026
SUPC
STATEMENT OF USE PROCESSING COMPLETE
01/27/2026
AITU
CASE ASSIGNED TO INTENT TO USE PARALEGAL
01/27/2026
IUAF
USE AMENDMENT FILED
07/22/2025
EISU
TEAS STATEMENT OF USE RECEIVED
07/22/2025
EXRA
NOTICE OF APPROVAL OF EXTENSION REQUEST E-MAILED
03/04/2025
EX1G
SOU EXTENSION 1 GRANTED
01/17/2025
EXT1
SOU EXTENSION 1 FILED
01/17/2025
EEXT
SOU TEAS EXTENSION RECEIVED
01/17/2025
NOAM
NOA E-MAILED - SOU REQUIRED FROM APPLICANT
07/23/2024
NPUB
OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
05/28/2024
PUBO
PUBLISHED FOR OPPOSITION
05/28/2024
NONP
NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED
05/08/2024
CNSA
APPROVED FOR PUB - PRINCIPAL REGISTER
04/23/2024
DOCK
ASSIGNED TO EXAMINER
03/23/2024
MDSC
NOTICE OF DESIGN SEARCH CODE E-MAILED
08/17/2023
NWOS
NEW APPLICATION OFFICE SUPPLIED DATA ENTERED
08/16/2023
NWAP
NEW APPLICATION ENTERED
07/21/2023
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