NRCC
NOTICE OF REGISTRATION CONFIRMATION EMAILED
11/07/2023
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Official data from USPTO
MICRONICS JAPAN
Did you know this trademark is already registered in United States?
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Active USPTO registrationType: WordOffice: United States
Quick snapshot
MICRONICS JAPAN
ST13
US500000097513203Class
9, 37
Filing
97513203
Registration
7210901
Risk and opportunity diagnosis
Executive reading for naming, filing, and monitoring decisions.
USPTO status
Active USPTO registration
Case type
Application and registration
Recorded events
22
Latest update
11/07/2023
Trademark type
Word
Nice classes
9, 37
Filing date
07/21/2022
Registration date
11/07/2023
Expiration date
-
Complete case details
Structured fields from the responsible authority and the official record.
Status date
11/07/2023
Last transaction
11/07/2023
Responsible office
United States Patent and Trademark Office
Status code
700
Official register
Principal Register
Filing basis
Intent to use, Foreign priority
Drawing code
4
Owner type
99
Owner location
Musashino-shi, Tokyo, JP
Examiner
BURKE, JUSTINE
Law office
N30
Current location
PUBLICATION AND ISSUE SECTION
Holders and representatives
Holders
K. M. (pessoa física)
Representatives
LEIGH ANN LINDQUIST SUGHRUE MION, PLLC
Technical classification
Nice Classes
Class 9Class 37
Vienna Codes
No Vienna codes available.
Goods and services
Class 9
Probe cards for testing integrated circuits and semiconductor devices; probe cards for use in connection with inspection of semiconductor devices and integrated circuits; testinginspectionprobing instrumentssemiconductor testing instruments for making electrical contact with probes to semiconductor devices for use in the process of manufacturetestinginspection of semiconductor devices and integrated circuit; probes for testing of integrated circuits and semiconductor devices; probe stations being a positioning apparatus for connecting probes to semiconductor device electrodes for testing and inspecting integrated circuits and semiconductor devicesprecision instruments for manipulation and positioning of microscopic objects; probes for scientific purposes for the measurement of electronic signals; electric contacts; electrical instrumentssockets and socket terminal carriers being electrical terminal blocks
Class 37
Repair or maintenance of probe cards for use in connection with inspection of semiconductor devices and integrated circuits; repair or maintenance of probe cards for testing integrated circuits and semiconductor devices
Publications
History of USPTO decisions and trademark events.
22 publications found
R.PR
REGISTERED-PRINCIPAL REGISTER
11/07/2023
NPUB
OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
08/22/2023
PUBO
PUBLISHED FOR OPPOSITION
08/22/2023
NONP
NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED
08/02/2023
CNSA
APPROVED FOR PUB - PRINCIPAL REGISTER
07/18/2023
XAEC
EXAMINER'S AMENDMENT ENTERED
07/18/2023
GNEN
NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED
07/18/2023
GNEA
EXAMINERS AMENDMENT E-MAILED
07/18/2023
CNEA
EXAMINERS AMENDMENT -WRITTEN
07/18/2023
TEME
TEAS/EMAIL CORRESPONDENCE ENTERED
07/17/2023
CRFA
CORRESPONDENCE RECEIVED IN LAW OFFICE
07/17/2023
TROA
TEAS RESPONSE TO OFFICE ACTION RECEIVED
07/12/2023
GNRN
NOTIFICATION OF NON-FINAL ACTION E-MAILED
05/12/2023
GNRT
NON-FINAL ACTION E-MAILED
05/12/2023
CNRT
NON-FINAL ACTION WRITTEN
05/12/2023
DOCK
ASSIGNED TO EXAMINER
05/08/2023
AMPX
PRELIMINARY/VOLUNTARY AMENDMENT - ENTERED
09/14/2022
ALIE
ASSIGNED TO LIE
09/14/2022
NWOS
NEW APPLICATION OFFICE SUPPLIED DATA ENTERED
08/11/2022
PARI
TEAS VOLUNTARY AMENDMENT RECEIVED
08/10/2022
NWAP
NEW APPLICATION ENTERED
07/25/2022
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