NRCC
NOTICE OF REGISTRATION CONFIRMATION EMAILED
07/09/2024
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Official data from USPTO
NANOMETRICS
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Active USPTO registrationType: WordOffice: United States
Quick snapshot
NANOMETRICS
ST13
US500000097308047Class
7, 9, 42
Filing
97308047
Registration
7444130
Risk and opportunity diagnosis
Executive reading for naming, filing, and monitoring decisions.
USPTO status
Active USPTO registration
Case type
Application and registration
Recorded events
26
Latest update
07/09/2024
Trademark type
Word
Nice classes
7, 9, 42
Filing date
03/11/2022
Registration date
07/09/2024
Expiration date
-
Complete case details
Structured fields from the responsible authority and the official record.
Status date
07/09/2024
Last transaction
07/09/2024
Responsible office
United States Patent and Trademark Office
Status code
700
Official register
Principal Register
Filing basis
Intent to use
First use anywhere
09/01/2023
First use in commerce
09/01/2023
Drawing code
4
Owner type
03
Owner location
Wilmington, MA, US
Examiner
ALTREE, NICHOLAS
Law office
L70
Current location
PUBLICATION AND ISSUE SECTION
Holders and representatives
Holders
Onto Innovation Inc.
Representatives
Heather J. Kliebenstein MERCHANT & GOULD P.C.
Technical classification
Nice Classes
Class 7Class 9Class 42
Vienna Codes
No Vienna codes available.
Goods and services
Class 7
Lithography machines for the manufacture of microelectronicsintegrated circuitslight emitting diodessemiconductors on laminar substrates including wafersglass panelspackaging panels such as copper plate or plastic; Optical metrologycharacterizationinspection systems comprised of a machinecomponents and operating software therefor sold as a unit for use in the production of laminar substrates including discrete electronic componentssemiconductors including non-volatile and volatile memory devicesfoundry and logic devicesasic devicescmos image sensorsmicroelectromechanical systemslight emitting diodesother micro and nano technology devicessystem in packageheterogeneous packagingother advanced packaging electronics technologies; optical metrologycharacterizationinspection systems comprised of machinecomponents and operating software therefor sold as a unit for use in the production of precision machined optical surfacesoptical coatingsoptical assemblies including reference flatsphereasphere and assemblies composed of both refractive and reflective components
Class 9
Optical metrologycharacterizationinspection systems comprised of machinecomponents and operating software therefor sold as a unit for use in the testing of transmitted wavefront and surface shape of optical componentssurface roughness of opticsmetalssemiconductorsceramicsplasticspaints and other finely finished materialsdefects and geometries of parts in aerospaceautomotivepower generationsemiconductordata storagebearingsadditive manufacturing and other precision-machined components; interferometers for use in the testing of transmitted wavefront and surface shape of optical componentssurface roughness of opticsmetalssemiconductorsceramicsplasticspaints and other finely finished materialsdefects and geometries of parts in aerospaceautomotivepower generationsemiconductordata storagebearingsadditive manufacturing and other precision-machined components; downloadable softwareprocess control and defect analysis software for use in the production of laminar substrates including discrete electronic componentssemiconductors including non-volatile and volatile memory devicesfoundry and logic devicesasic devicescmos image sensorsmicroelectromechanical systemslight emitting diodesother micro and nano technology devicessystem in packageheterogeneous packagingother advanced packaging electronics technologies; downloadable software for the semiconductor industrydownloadable software for identifying defects in semiconductor structuresdownloadable software for identifying semiconductor fabrication process excursionsdownloadable software for recording and reviewing defects in semiconductors structuresdownloadable software for identifying root causes of defects in semiconductor structuresdownloadable software for controlling and monitoring semiconductor fabrication equipment; metrology inspection equipment for use in the manufacturinginspectiontesting and repair of semiconductor substrates; metrology inspection equipment and devicesinstruments and devices that sense and capture images of semiconductor componentssemiconductor waferssemiconductor diepackaged integrated circuitsprinted circuit boardsliquid crystal displayselectronic displaysdisk storage mediainspect these images for defectscoordinate or position determinationidentificationpresence or absence of a featurecharacteristic or substance thereon; metrology inspection systems comprised of one or more light sourcesone or more cameras and/or sensors in communication with embedded computer software and hardware used for the measurement of thicknessadhesion propertiesstructural properties of semiconductor materials and for monitoring the performance of semiconductor fabrication processes; optical inspection equipment for 2D and 3D inspection of semiconductor materials; metrology instruments for metrology purposesapparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materialsconsisting of optical microscopeelectron microscopespectrophotometerellipsometer and scanning slit densitometers
Class 42
Providing temporary use on onlinenon-downloadable process control and defect analysis software for use in the production of laminar substrates including discrete electronic componentssemiconductors including non-volatile and volatile memory devicesfoundry and logic devicesasic devicescmos image sensorsmicroelectromechanical systemslight emitting diodesother micro and nano technology devicessystem in packageheterogenous packagingother advanced packaging electronics technologies; providing online non-downloadable software for the semiconductor industryonline non-downloadable software for identifying defects in semiconductor structuresonline non-downloadable software for identifying semiconductor fabrication process excursionsonline non-downloadable software for recording and reviewing defects in semiconductors structuresonline non-downloadable software for identifying root causes of defects in semiconductor structuresonline non-downloadable software for controlling and monitoring semiconductor fabrication equipment
Publications
History of USPTO decisions and trademark events.
26 publications found
R.PR
REGISTERED-PRINCIPAL REGISTER
07/09/2024
SUNA
NOTICE OF ACCEPTANCE OF STATEMENT OF USE E-MAILED
05/31/2024
CNPR
ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED
05/31/2024
SUPC
STATEMENT OF USE PROCESSING COMPLETE
05/29/2024
AITU
CASE ASSIGNED TO INTENT TO USE PARALEGAL
05/28/2024
IUAF
USE AMENDMENT FILED
04/30/2024
EISU
TEAS STATEMENT OF USE RECEIVED
04/30/2024
EXRA
NOTICE OF APPROVAL OF EXTENSION REQUEST E-MAILED
12/02/2023
EX1G
SOU EXTENSION 1 GRANTED
11/30/2023
EXT1
SOU EXTENSION 1 FILED
11/30/2023
EEXT
SOU TEAS EXTENSION RECEIVED
11/30/2023
NOAM
NOA E-MAILED - SOU REQUIRED FROM APPLICANT
05/30/2023
NPUB
OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
04/04/2023
PUBO
PUBLISHED FOR OPPOSITION
04/04/2023
NONP
NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED
03/15/2023
CNSA
APPROVED FOR PUB - PRINCIPAL REGISTER
03/01/2023
TEME
TEAS/EMAIL CORRESPONDENCE ENTERED
03/01/2023
CRFA
CORRESPONDENCE RECEIVED IN LAW OFFICE
02/28/2023
TROA
TEAS RESPONSE TO OFFICE ACTION RECEIVED
02/28/2023
GNRN
NOTIFICATION OF NON-FINAL ACTION E-MAILED
08/30/2022
GNRT
NON-FINAL ACTION E-MAILED
08/30/2022
CNRT
NON-FINAL ACTION WRITTEN
08/30/2022
DOCK
ASSIGNED TO EXAMINER
05/02/2022
NWOS
NEW APPLICATION OFFICE SUPPLIED DATA ENTERED
03/16/2022
NWAP
NEW APPLICATION ENTERED
03/15/2022
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