REM1
COURTESY REMINDER - SEC. 8 (6-YR) E-MAILED
04/28/2025
Back to search
Official data from USPTO
SEMILAB
Did you know this trademark is already registered in United States?
Before investing in name, identity, and promotion, validate collision risk and registration strategy to avoid wasting time and budget.
Active USPTO registrationType: WordOffice: United States
Risk and opportunity diagnosis
Executive reading for naming, filing, and monitoring decisions.
USPTO status
Active USPTO registration
Case type
Application and registration
Recorded events
15
Latest update
04/29/2025
Trademark type
Word
Nice classes
9, 42
Filing date
09/26/2019
Registration date
04/28/2020
Expiration date
-
Complete case details
Structured fields from the responsible authority and the official record.
Status date
04/28/2020
Last transaction
04/29/2025
Responsible office
United States Patent and Trademark Office
Status code
700
Official register
Principal Register
First use anywhere
06/11/2009
First use in commerce
06/11/2009
Drawing code
4
Owner type
03
Owner location
Budapest, HU
Examiner
DINALLO, KEVIN
Current location
Historical data usage
Holders and representatives
Holders
SEMILAB Semiconductor Physics Laboratory Co., Ltd.
Representatives
Patrick A. Reid HILL WARD HENDERSON, P.A.
Technical classification
Nice Classes
Class 9Class 42
Vienna Codes
No Vienna codes available.
Goods and services
Class 9
Scientific instruments in the field of semiconductor manufacturingmetrology instruments for contamination monitoringdefect inspectioncontamination analysisnano surface characterizationEPI resistivity measurementEPI thickness measurementcompound material characterizationion implant monitoringthin film thickness measurementelectrical characterization of dielectrics and interfacescharacterization of 3D structuresmetallization controldielectric porosity measurement; Photovoltaic instruments for controlling the crystalline silicon solar cell manufacturing processinstruments for silicon ingot and block testingsilicon wafer sortinginline process controloffline process controllaboratory applicationsthin film applications; Scientific instruments for monitoring the production of flat panel displaysinstruments for monitoring the manufacturing of full-tone and half tone (photoresist)printed OLED sub-pixel characterizationIGZO electrical characterizationsheet resistance measurementthin film characterizationELA process characterization (LTPS)bare glass
Class 42
Research and development in the field of semiconductor metrologyphotovoltaic metrologyflat panel display metrology; Custom design of metrology equipment to the specification of others
Publications
History of USPTO decisions and trademark events.
15 publications found
NURC
NOTICE OF UPDATED REGISTRATION CONFIRMATION EMAILED
03/11/2025
COC.
CORRECTION UNDER SECTION 7 - PROCESSED
02/20/2025
EROP
TEAS RESPONSE TO OFFICE ACTION-POST REG RECEIVED
02/19/2025
PRAM
POST REGISTRATION ACTION MAILED - SEC. 7
01/21/2025
APRE
CASE ASSIGNED TO POST REGISTRATION PARALEGAL
12/09/2024
ES7R
TEAS SECTION 7 REQUEST RECEIVED
06/05/2024
R.PR
REGISTERED-PRINCIPAL REGISTER
04/28/2020
NPUB
OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
02/11/2020
PUBO
PUBLISHED FOR OPPOSITION
02/11/2020
NONP
NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED
01/22/2020
CNSA
APPROVED FOR PUB - PRINCIPAL REGISTER
01/03/2020
DOCK
ASSIGNED TO EXAMINER
12/30/2019
NWOS
NEW APPLICATION OFFICE SUPPLIED DATA ENTERED
10/02/2019
NWAP
NEW APPLICATION ENTERED
09/30/2019
Continuous trademark protection
Get notified about every new filing that threatens SEMILAB or your mark.
Professional 24-month watch service: we monitor USPTO for you and alert you in time to oppose — before conflicts become losses.