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Official data from USPTO

DIGITAL SURF

Did you know this trademark is already registered in United States?

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Active USPTO registrationType: WordOffice: United States

Quick snapshot

DIGITAL SURF

ST13

US500000079273624

Class

9, 16, 35, 41, 42

Filing

79273624

Registration

6202704

Risk and opportunity diagnosis

Executive reading for naming, filing, and monitoring decisions.

USPTO status

Active USPTO registration

Case type

Application and registration

Recorded events

26

Latest update

11/25/2025

Trademark type

Word

Nice classes

9, 16, 35, 41, 42

Filing date

10/11/2019

Registration date

11/24/2020

Expiration date

-

Complete case details

Structured fields from the responsible authority and the official record.

Status date

11/24/2020

Last transaction

11/25/2025

Responsible office

United States Patent and Trademark Office

Status code

700

Official register

Principal Register

Drawing code

4

Owner type

99

Owner location

FR

Examiner

KUMIS,SCOTT N

Law office

N70

Current location

PUBLICATION AND ISSUE SECTION

Holders and representatives

Holders

D. S. (pessoa física)

Representatives

Andrew W. Chu CRAFT CHU PLLC

Technical classification

Nice Classes

Class 9Class 16Class 35Class 41Class 42

Vienna Codes

No Vienna codes available.

Goods and services

Class 9

Precision measuring apparatusscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticleimageformtopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectralmulti-spectralfourier analysismeasuring apparatus; electric measuring apparatusscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticleimageformtopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectralmulti-spectralfourier analysis measuring apparatus; measuring apparatus and instrumentsscale sensitive fractalcontourtextureforce curve analysiscolocalizationfree form surfaceparticleimageformtopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectralmulti-spectralfourier analysis measuring apparatus; computer systems comprised of computer hardware; recorded software for the analysis and processing of imagesin particular microscopy images including scanning electron microscopy imagesscanning probe microscopy imageshyperspectral microscopy imagesimages generated by tomography including x-ray computed tomographythe analysis of formtopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral data fourier analysisdesk top publishing and reporting especially by workflow presentationof scientifictechnicalstatistical datastatistical analysis of scientific and microscopy data ; optical frequency metrology devices; micrometers; recorded USB software drivers; interfaces for detectors; recorded software for conversion of document images into electronic format; transmitters of electronic signals; recorded computer software for data processing; apparatus for recordingtransmission or reproduction of information; tape measures; measuring instrumentsprotractors; electric regulating apparatus; checking apparatus and instruments for measuringtesting and checking the temperaturepressurequantity and concentration of gas and liquids; testing apparatus for testing printed circuit boards not for medical use; downloadable software for remote monitoring and analysis; scientificnauticalsurveyingphotographiccinematographicopticalweighingmeasuringsignalingcheckinglife-saving and teaching apparatus and instrumentsoptical profilometersinterferometersoptical microscopesconfocal microscopesscanning electron microscopestransmission electron microscopesscanning probe microscopesatomic force microscopestransmission electron microscopyspectrometersraman spectroscopestomographs including x-ray tomographs; apparatus for recordingtransmissionreceptionprocessing or reproduction of soundsimages or data; microscopes; microscopy diffraction apparatus; electronic identification cards in the nature of cards encoded with security features for identification purposes; optical sensors; measuring sensors namelyx-ray detectorscontact and non-contact distance measuring sensorselectron and photon detectors in particular for microscopy and profilometrycathodoluminescence detectorsfour-quadrant electronic detectorslaser-based distance and form measuring sensorsother than for medical use; electric and electronic control apparatus and instrumentsscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticleimageformtopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectralmulti-spectralmeasuring apparatus; apparatus and instruments for scanning probe microscopymicroscopes; apparatus and instruments for microscopymicroscopes; non-medical electronic imaging devices for ridologysclerologyrayid and eyology; data processing apparatus; optical readers for data processing; recorded data processing software; blank recordable optical data media; data processing equipment in the nature of scanners; simultaneous interpretation receivers; computer user manuals in electronic format recorded on electronic media; optical inspection apparatus and instruments; computers; recorded software for the analysis of measurement datain particular from metrology or relief mapping apparatus; recorded image analysis softwarein particular from all types of microscopes; recorded software for characterizing or measuring grains and particles; recorded software for the analysis of surface conditionsin particular roughness and waviness; recorded software for the analysis of surveyingin particular for atomic-force microscopeselectron microscopesoptical and contact profilometerscamerassystems used by surveyorssystems used by geographers; recorded software for analyzing dimensions; recorded software for analyzing the formin particular errors in form in connection with a model; recorded software for analyzing straightnessflatnessthicknesscircularitycylindricityanglesdistance and contours; recorded spectral analysis softwarein particular multi-spectral and hyper-spectral software for the analysis of the chemical ingredients used in connection with all types of microscopesin particular for spectroscopy testing of force and the analysis of pressure curves; recorded software for mapping at any scale in particular land-cover mapping; recorded software for the analysis of the earth's relief and software for the multi-spectral or hyper-spectral analysis of geographical data; recorded software for the reconstruction of the relief from imagesin particular geographical images or from a camera or microscope; recorded software to view or analyze on a microscopic scale; recorded software for analyzing color; recorded software for the analysis of use of stains or diffuse objects; recorded software for color enhancementin particular automatic or semi-automatic images from electronic microscopes; recorded statistical monitoring software for the development of measurement parameters; recorded software for monitoring the quality of a production; recorded software for data acquisition and controlincluding motionof any system enabling the acquisition of the data listed above

Class 16

Printed manuals in the field of software for analysis and processing of imagesin particular microscopy imagesthe analysis of formscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticle analysistopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral datatomography including x-ray computed tomographyfourier analysis; Printed computer manuals for software for analysis and processing of imagesin particular microscopy imagesthe analysis of formscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticle analysistopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral datatomography including x-ray computed tomographyfourier analysis; Printed instruction manuals in the field of software for analysis and processing of imagesin particular microscopy imagesthe analysis of formscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticle analysistopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral datatomography including x-ray computed tomographyfourier analysis; printed manuals in the field of software for analysis and processing of imagesin particular microscopy imagesthe analysis of formscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticle analysistopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral datatomography including x-ray computed tomographyfourier analysis; Printed computer software manuals; Printed user instructions in the field of software for analysis and processing of imagesin particular microscopy imagesthe analysis of formscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticle analysistopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral datatomography including x-ray computed tomographyfourier analysis; Printed operating instructions in the field of software for analysis and processing of imagesin particular microscopy imagesthe analysis of formscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticle analysistopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral datatomography including x-ray computed tomographyfourier analysis; periodical print publications in the field of software for optical profilometersinterferometersoptical microscopesconfocal microscopesscanning electron microscopestransmission electron microscopesscanning probe microscopesatomic force microscopestransmission electron microscopyspectrometersraman spectroscopestomographs including x-ray tomographsin the field of software for analysis and processing of imagesin particular microscopy imagesthe analysis of formscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticle analysistopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral datatomography including x-ray computed tomographyfourier analysis

Class 35

Presentation and demonstration of goods for the purpose of promoting the goods of others; Organization and conducting of product presentations; presentation of goods on all communication mediafor retail purposesproviding home shopping services in the field of software for analysis and processing of imagesin particular microscopy imagesthe analysis of formscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticle analysistopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral datatomography including x-ray computed tomographyfourier analysis by means of internet websiteexhibitstrade showstelephonesocial mediae-mailswebinarsprinted advertising in specialized magazinesbanner advertising on specialized websitesnewslettersbrochurespackaging; presentation of goods on the Internetpromoting the goods of others through online medium

Class 41

Preparation and coordination of educational conferencescongresses and symposiums; organization and conducting of educational colloquiumsconferences and congresses; preparation and coordination of educational conferences and congresses; practical training and educational demonstrations in the field of software training for analysis and processing of imagesin particular microscopy imagesthe analysis of formscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticle analysistopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral datatomography including x-ray computed tomographyfourier analysis; training services in the field of software for analysis and processing of imagesin particular microscopy imagesthe analysis of formscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticle analysistopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral datatomography including x-ray computed tomographyfourier analysis; information technology training; organization of training sessions for others; training course services in the field of software for analysis and processing of imagesin particular microscopy imagesthe analysis of formscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticle analysistopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral datatomography including x-ray computed tomographyfourier; training in the maintenance of computers; organization of training seminars in the field of software for analysis and processing of imagesin particular microscopy imagesthe analysis of formscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticle analysistopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral datatomography including x-ray computed tomographyfourier; training relating to software system development; training courses relating to software; training services concerning the use of software; training in the operation of software systems; publication of manuals; guide publication services; publication of electronic magazines; publication of booklets; publication of reviews online; on-line publication of electronic journals; online publication of specialized electronic books and journals; provision of non-downloadable online electronic publications in the nature of newsletterswebinarsvideosarticlesbrochuresillustrationsin the field of software for analysis and processing of imagesin particular microscopy imagesthe analysis of formscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticle analysistopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral datatomography including x-ray computed tomographyfourier analysis; provision of non-downloadable on-line electronic publications in the nature of newsletterswebinarsvideosarticlesbrochuresillustrationsin the field of data processing; online publication of user manuals in the field of software for analysis and processing of imagesin particular microscopy imagesthe analysis of formscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticle analysistopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral datatomography including x-ray computed tomographyfourier analysis; organizing of educational conferences with respect to data processing; publication of periodicalsbooks and manuals in the field of data processing

Class 42

Conversion of computer programs and datanot physical conversion; conversion of data or documents from physical to electronic media; conversion of electronic information; quality control services for others; inspection of products for quality control purposes; digitization of sounds and images; topographic surveying; design of mechanicalelectromechanical and optoelectronic apparatus and instruments; software installation; software design and development; software as a service (SaaS)featuring software for the analysis and processing of imagesin particular microscopy imagesthe analysis of formscale sensitive fractalcontourtextureforce curvecolocalizationfree form surfaceparticle analysistopographyroundnesscylindricityroughnesswavinessthicknessdistanceadhesiondistortionatomic geometryhyperspectral cubesmulti-spectral datatomography including x-ray computed tomographyfourier analysis; updating of software; maintenance of computer software; programming for computers; research and development of new products for third parties; scientific and technological consulting servicesconducting of technical project studies; Scientific and technological servicesscientific analyses in the field of microscopyincluding scanning electron microscopyscanning Probe Microscopyhyperspectral microscopyprofilometryform analysissurface texture analysischemometryspectroscopytomography including x-ray computed tomography; Scientific and technological services scientific research and analysis in the field of microscopyincluding scanning electron microscopyscanning Probe Microscopyhyperspectral microscopyprofilometryform analysissurface texture analysischemometryspectroscopytomography including x-ray computed tomography; Scientific and technological services technical data analysis in the field of microscopyincluding scanning electron microscopyscanning Probe Microscopyhyperspectral microscopyprofilometryform analysissurface texture analysischemometryspectroscopytomography including x-ray computed tomography; computer-aided industrial designresearchtesting and analysis services; Provision of technical studies relating to computer programming; Conducting scientific feasibility studies; scientific research; technical research in the field of microscopyincluding scanning electronscanning Probe Microscopyhyperspectral microscopyscale sensitive fractal analysiscontour analysisprofilometry analysistexture analysisforce curve analysiscolocalization analysisfree form surface analysisparticle analysisimage analysisform analysissurface texture analysischemometryspectroscopy and data processing of these itemstomographyincluding x-ray computed tomographyfourier analysis; computer code conversion for others; test services for quality or standard certificationtestinganalysis and evaluation of the goods and services of others to determine conformity with certification standards; technical support services relating to softwaretroubleshooting of computer software problems; computer system analysis; information technology consultancy services; computer software consultancy; software development in the context of publishing of software; engineering surveying; engineering; rental of computer software; programming for computers; computer data recovery; off-site data backup; electronic data storage; monitoring of computer systems to detect breakdowns; monitoring of computer systems for the detection of unauthorized access or data protection breaches; data mining; decoding of encrypted data

Publications

History of USPTO decisions and trademark events.

26 publications found

REM3

COURTESY REMINDER - SEC. 71 (6-YR) E-MAILED

11/24/2025

FINO

FINAL DECISION TRANSACTION PROCESSED BY IB

03/21/2021

FICS

FINAL DISPOSITION NOTICE SENT TO IB

02/27/2021

FIMP

FINAL DISPOSITION PROCESSED

02/27/2021

FICR

FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB

02/24/2021

R.PR

REGISTERED-PRINCIPAL REGISTER

11/24/2020

NPUB

OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED

09/08/2020

PUBO

PUBLISHED FOR OPPOSITION

09/08/2020

NONP

NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED

08/19/2020

CNSA

APPROVED FOR PUB - PRINCIPAL REGISTER

08/06/2020

XAEC

EXAMINER'S AMENDMENT ENTERED

08/06/2020

GNEN

NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED

08/06/2020

GNEA

EXAMINERS AMENDMENT E-MAILED

08/06/2020

CNEA

EXAMINERS AMENDMENT -WRITTEN

08/06/2020

TEME

TEAS/EMAIL CORRESPONDENCE ENTERED

07/16/2020

CRFA

CORRESPONDENCE RECEIVED IN LAW OFFICE

07/15/2020

TROA

TEAS RESPONSE TO OFFICE ACTION RECEIVED

07/15/2020

RFNT

REFUSAL PROCESSED BY IB

02/28/2020

RFCS

NON-FINAL ACTION MAILED - REFUSAL SENT TO IB

02/10/2020

RFRR

REFUSAL PROCESSED BY MPU

02/10/2020

RFCR

NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW

01/17/2020

CNRT

NON-FINAL ACTION WRITTEN

01/16/2020

DOCK

ASSIGNED TO EXAMINER

01/16/2020

MAFR

APPLICATION FILING RECEIPT MAILED

12/14/2019

NWOS

NEW APPLICATION OFFICE SUPPLIED DATA ENTERED

12/10/2019

REPR

SN ASSIGNED FOR SECT 66A APPL FROM IB

12/05/2019

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