(11) 98705-3426
TrademarkIQ iconTrademarkIQ
Back to search
Official data from USPTO

LEICA

Did you know this trademark is already registered in United States?

Before investing in name, identity, and promotion, validate collision risk and registration strategy to avoid wasting time and budget.

Active USPTO registrationType: WordOffice: United States

Quick snapshot

LEICA

ST13

US500000074191688

Class

9, 10, 37, 41, 42

Filing

74191688

Registration

1744339

Risk and opportunity diagnosis

Executive reading for naming, filing, and monitoring decisions.

USPTO status

Active USPTO registration

Case type

Application and registration

Recorded events

29

Latest update

07/10/2023

Trademark type

Word

Nice classes

9, 10, 37, 41, 42

Filing date

08/05/1991

Registration date

01/05/1993

Expiration date

-

Complete case details

Structured fields from the responsible authority and the official record.

Status date

07/10/2023

Last transaction

07/10/2023

Responsible office

United States Patent and Trademark Office

Status code

800

Official register

Principal Register

Filing basis

Foreign priority

Drawing code

1

Owner type

03

Owner location

17-37 35578 WETZLAR, DE

Examiner

GREER, CYNTHIA

Law office

J60

Current location

GENERIC WEB UPDATE

Holders and representatives

Holders

LEICA MICROSYSTEMS IR GMBH
Leica Technology BV

Representatives

David J. Davis Baker & McKenzie LLP

Technical classification

Nice Classes

Class 9Class 10Class 37Class 41Class 42

Vienna Codes

No Vienna codes available.

Goods and services

Class 9

scientificfine mechanicalopticalelectronic apparatus and devices;microscopes including optical microscopesstereo microscopeslaser scanning microscopesmeasuring microscopesphoto microscopesscanning electron microscopesacoustic microscopesscanning tunnel microscopesscanning near field microscopes; macroscopesphoto macroscopes; microtomes;ultramicrotomescryomicrotomes; devices for electron beam microlithography comprising electron beam scannersimage processing computersimage monitors and microlithographs; electron beam measuring and analysis devices comprising electron beam scannerselectronic image processing computers and visual display monitors for measuring microdimensions or surface character of objects; plotters;flat bed plotterstool plottersdrum plotterslaser scanning plotters; image analysis devices and apparatus comprising image scannerselectronic image processing computersvisual image display monitors; devices for manipulatingstoring and displaying electronic images for use in evaluationpattern recognitionenhancementmeasurementanalysisdisplay and reproduction of lightelectron beamthermal and/or acoustic images; photogrammetric apparatus and devices for producingmeasuring and evaluating aerial photographs; cartographic and topographic apparatus and devices;stereo photograph viewersstereo image evaluators and plotters for making maps based on aerial photographs; geodetic and nautical apparatus and devices;theodoliteslevelstachometersslope measuring devicescompasses; global position determining devices and apparatus for receiving and analyzing signals from navigational satellites to determine global position for surveying or navigational purposes; distance measuring devices;laser distance metersdistance sensors; coordinate measuring devices and apparatus for determining and monitoring the shapespositions and dimensions of objects without touching them; optoelectronic sensors for detecting positionshape and/or displacement of objects; thermal image sensors and residual light amplifiers for night vision equipmentmilitary fire control systems and aerial surveying; and parts of the aforementioned devices and apparatus; all sold individually or as parts of integrated systems; and computer software for use in the fields of opticssurveyingnavigationmicroscopyphotogrammetryelectron beam lithographyindustrial measurementimage analysiscartographyplotterscomputer controlled cutting robots

Class 10

opthamological apparatus and devices;refractometerskeratometerstonometerseye chart projectors; operating microscopes; individually or as parts of integrated systems

Class 37

maintenance and repair of fine mechanicalopticalphotographicphotogrammetricphysicsmeasuringelectricalelectronicoptronicelectroacoustic and opthamological apparatusdevices and systems

Class 41

educational services; namelyeducational programs and lectures; audio-visual presentationspublication of technical informationproduct information and scientific notices all in the fields of opticsmicroscopyphotographysurveyingcartographyophthamologyindustrial measurement and quality controlimage analysis

Class 42

computer programming services; computer consulting services; and computerized processing and analysis of image data obtained by lightelectron beamthermal and/or acoustic scanning of objects

Publications

History of USPTO decisions and trademark events.

29 publications found

NA89

NOTICE OF ACCEPTANCE OF SEC. 8 & 9 - E-MAILED

07/10/2023

RNL3

REGISTERED AND RENEWED (THIRD RENEWAL - 10 YRS)

07/10/2023

89AG

REGISTERED - SEC. 8 (10-YR) ACCEPTED/SEC. 9 GRANTED

07/10/2023

APRE

CASE ASSIGNED TO POST REGISTRATION PARALEGAL

07/07/2023

E89R

TEAS SECTION 8 & 9 RECEIVED

12/13/2022

REM2

COURTESY REMINDER - SEC. 8 (10-YR)/SEC. 9 E-MAILED

01/05/2022

ARAA

ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED

08/17/2018

REAP

TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED

08/17/2018

NA89

NOTICE OF ACCEPTANCE OF SEC. 8 & 9 - MAILED

11/19/2012

RNL2

REGISTERED AND RENEWED (SECOND RENEWAL - 10 YRS)

11/19/2012

89AG

REGISTERED - SEC. 8 (10-YR) ACCEPTED/SEC. 9 GRANTED

11/19/2012

APRE

CASE ASSIGNED TO POST REGISTRATION PARALEGAL

11/19/2012

E89R

TEAS SECTION 8 & 9 RECEIVED

10/26/2012

CFIT

CASE FILE IN TICRS

06/11/2008

CORV

REVIEW OF CORRESPONDENCE COMPLETE

08/26/2006

MAIL

PAPER RECEIVED

03/25/2003

RNL1

REGISTERED AND RENEWED (FIRST RENEWAL - 10 YRS)

03/06/2003

89AG

REGISTERED - SEC. 8 (10-YR) ACCEPTED/SEC. 9 GRANTED

03/06/2003

89AF

REGISTERED - COMBINED SECTION 8 (10-YR) & SEC. 9 FILED

11/14/2002

MAIL

PAPER RECEIVED

11/14/2002

C15A

REGISTERED - SEC. 8 (6-YR) ACCEPTED & SEC. 15 ACK.

08/12/1999

815F

REGISTERED - SEC. 8 (6-YR) & SEC. 15 FILED

01/05/1999

R.PR

REGISTERED-PRINCIPAL REGISTER

01/05/1993

PUBO

PUBLISHED FOR OPPOSITION

10/13/1992

NPUB

NOTICE OF PUBLICATION

09/11/1992

CNSA

APPROVED FOR PUB - PRINCIPAL REGISTER

07/23/1992

CRFA

CORRESPONDENCE RECEIVED IN LAW OFFICE

06/29/1992

CNRT

NON-FINAL ACTION MAILED

12/27/1991

DOCK

ASSIGNED TO EXAMINER

11/06/1991

Continuous trademark protection

Get notified about every new filing that threatens LEICA or your mark.

Professional 24-month watch service: we monitor USPTO for you and alert you in time to oppose — before conflicts become losses.