DIGITAL SURF

Classe 9

Precision measuring apparatus, namely, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle, image, form, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral, multi-spectral, fourier analysis, measuring apparatus; electric measuring apparatus, namely, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle, image, form, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral, multi-spectral, fourier analysis measuring apparatus; measuring apparatus and instruments, namely, scale sensitive fractal, contour, texture, force curve analysis, colocalization, free form surface, particle, image, form, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral, multi-spectral, fourier analysis measuring apparatus; computer systems comprised of computer hardware; recorded software for the analysis and processing of images, in particular microscopy images including scanning electron microscopy images, scanning probe microscopy images, hyperspectral microscopy images, images generated by tomography including x-ray computed tomography, the analysis of form, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data fourier analysis, desk top publishing and reporting especially by workflow presentation, of scientific, technical, statistical data, statistical analysis of scientific and microscopy data ; optical frequency metrology devices; micrometers; recorded USB software drivers; interfaces for detectors; recorded software for conversion of document images into electronic format; transmitters of electronic signals; recorded computer software for data processing; apparatus for recording, transmission or reproduction of information; tape measures; measuring instruments, namely, protractors; electric regulating apparatus; checking apparatus and instruments for measuring, testing and checking the temperature, pressure, quantity and concentration of gas and liquids; testing apparatus for testing printed circuit boards not for medical use; downloadable software for remote monitoring and analysis; scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signaling, checking, life-saving and teaching apparatus and instruments, namely, optical profilometers, interferometers, optical microscopes, confocal microscopes, scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, atomic force microscopes, transmission electron microscopy,spectrometers, raman spectroscopes, tomographs including x-ray tomographs; apparatus for recording, transmission, reception, processing or reproduction of sounds, images or data; microscopes; microscopy diffraction apparatus; electronic identification cards in the nature of cards encoded with security features for identification purposes; optical sensors; measuring sensors namely, x-ray detectors, contact and non-contact distance measuring sensors, electron and photon detectors in particular for microscopy and profilometry, cathodoluminescence detectors, four-quadrant electronic detectors, laser-based distance and form measuring sensors, other than for medical use; electric and electronic control apparatus and instruments, namely, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle, image, form, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral, multi-spectral, measuring apparatus; apparatus and instruments for scanning probe microscopy, namely, microscopes; apparatus and instruments for microscopy, namely, microscopes; non-medical electronic imaging devices for ridology, sclerology, rayid and eyology; data processing apparatus; optical readers for data processing; recorded data processing software; blank recordable optical data media; data processing equipment in the nature of scanners; simultaneous interpretation receivers; computer user manuals in electronic format recorded on electronic media; optical inspection apparatus and instruments; computers; recorded software for the analysis of measurement data, in particular from metrology or relief mapping apparatus; recorded image analysis software, in particular from all types of microscopes; recorded software for characterizing or measuring grains and particles; recorded software for the analysis of surface conditions, in particular roughness and waviness; recorded software for the analysis of surveying, in particular for atomic-force microscopes, electron microscopes, optical and contact profilometers, cameras, systems used by surveyors, and systems used by geographers; recorded software for analyzing dimensions; recorded software for analyzing the form, in particular errors in form in connection with a model; recorded software for analyzing straightness, flatness, thickness, circularity, cylindricity, angles, distance and contours; recorded spectral analysis software, in particular multi-spectral and hyper-spectral software for the analysis of the chemical ingredients used in connection with all types of microscopes, in particular for spectroscopy testing of force and the analysis of pressure curves; recorded software for mapping at any scale in particular land-cover mapping; recorded software for the analysis of the earth's relief and software for the multi-spectral or hyper-spectral analysis of geographical data; recorded software for the reconstruction of the relief from images, in particular geographical images or from a camera or microscope; recorded software to view or analyze on a microscopic scale; recorded software for analyzing color; recorded software for the analysis of use of stains or diffuse objects; recorded software for color enhancement, in particular automatic or semi-automatic images from electronic microscopes; recorded statistical monitoring software for the development of measurement parameters; recorded software for monitoring the quality of a production; recorded software for data acquisition and control, including motion, of any system enabling the acquisition of the data listed above

Classe 16

Printed manuals in the field of software for analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier analysis; Printed computer manuals for software for analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier analysis; Printed instruction manuals in the field of software for analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier analysis; printed manuals in the field of software for analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier analysis; Printed computer software manuals; Printed user instructions in the field of software for analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier analysis; Printed operating instructions in the field of software for analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier analysis; periodical print publications in the field of software for optical profilometers, interferometers, optical microscopes, confocal microscopes, scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, atomic force microscopes, transmission electron microscopy, spectrometers, raman spectroscopes, tomographs including x-ray tomographs, and in the field of software for analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier analysis

Classe 35

Presentation and demonstration of goods for the purpose of promoting the goods of others; Organization and conducting of product presentations; presentation of goods on all communication media, for retail purposes, namely, providing home shopping services in the field of software for analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier analysis by means of internet website, exhibits, trade shows, telephone, social media, e-mails, webinars, printed advertising in specialized magazines, banner advertising on specialized websites, newsletters, brochures, packaging; presentation of goods on the Internet, namely, promoting the goods of others through online medium

Classe 41

Preparation and coordination of educational conferences, congresses and symposiums; organization and conducting of educational colloquiums, conferences and congresses; preparation and coordination of educational conferences and congresses; practical training and educational demonstrations in the field of software training for analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier analysis; training services in the field of software for analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier analysis; information technology training; organization of training sessions for others; training course services in the field of software for analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier; training in the maintenance of computers; organization of training seminars in the field of software for analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier; training relating to software system development; training courses relating to software; training services concerning the use of software; training in the operation of software systems; publication of manuals; guide publication services; publication of electronic magazines; publication of booklets; publication of reviews online; on-line publication of electronic journals; online publication of specialized electronic books and journals; provision of non-downloadable online electronic publications in the nature of newsletters, webinars, videos, articles, brochures, illustrations, in the field of software for analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier analysis; provision of non-downloadable on-line electronic publications in the nature of newsletters, webinars, videos, articles, brochures, illustrations, in the field of data processing; online publication of user manuals in the field of software for analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier analysis; organizing of educational conferences with respect to data processing; publication of periodicals, books and manuals in the field of data processing

Classe 42

Conversion of computer programs and data, not physical conversion; conversion of data or documents from physical to electronic media; conversion of electronic information; quality control services for others; inspection of products for quality control purposes; digitization of sounds and images; topographic surveying; design of mechanical, electromechanical and optoelectronic apparatus and instruments; software installation; software design and development; software as a service (SaaS), featuring software for the analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier analysis; updating of software; maintenance of computer software; programming for computers; research and development of new products for third parties; scientific and technological consulting services, namely, conducting of technical project studies; Scientific and technological services, namely, scientific analyses in the field of microscopy, including scanning electron microscopy, scanning Probe Microscopy, hyperspectral microscopy, profilometry, form analysis, surface texture analysis, chemometry, spectroscopy, tomography including x-ray computed tomography; Scientific and technological services scientific research and analysis in the field of microscopy, including scanning electron microscopy, scanning Probe Microscopy, hyperspectral microscopy, profilometry, form analysis, surface texture analysis, chemometry, spectroscopy, tomography including x-ray computed tomography; Scientific and technological services technical data analysis in the field of microscopy, including scanning electron microscopy, scanning Probe Microscopy, hyperspectral microscopy, profilometry, form analysis, surface texture analysis, chemometry, spectroscopy, tomography including x-ray computed tomography; computer-aided industrial design, research, testing and analysis services; Provision of technical studies relating to computer programming; Conducting scientific feasibility studies; scientific research; technical research in the field of microscopy, including scanning electron, scanning Probe Microscopy, hyperspectral microscopy, scale sensitive fractal analysis, contour analysis, profilometry analysis, texture analysis, force curve analysis, colocalization analysis, free form surface analysis, particle analysis, image analysis, form analysis, surface texture analysis, chemometry, spectroscopy and data processing of these items, tomography, including x-ray computed tomography, fourier analysis; computer code conversion for others; test services for quality or standard certification, namely, testing, analysis and evaluation of the goods and services of others to determine conformity with certification standards; technical support services relating to software, namely, troubleshooting of computer software problems; computer system analysis; information technology consultancy services; computer software consultancy; software development in the context of publishing of software; engineering surveying; engineering; rental of computer software; programming for computers; computer data recovery; off-site data backup; electronic data storage; monitoring of computer systems to detect breakdowns; monitoring of computer systems for the detection of unauthorized access or data protection breaches; data mining; decoding of encrypted data