NAS8
NOTICE OF ACCEPTANCE OF SEC. 8 - E-MAILED
12/05/2024
Voltar para busca
Dado oficial do USPTO
XAN
Sabia que essa marca já está registrada no Estados Unidos?
Antes de investir em nome, identidade e divulgação, valide risco de colisão e estratégia de registro para não perder tempo nem budget.
Active USPTO registrationTipo: VerbalEscritório: US
Diagnóstico de risco e oportunidade
Leitura executiva para decisão de naming, protocolo e monitoramento.
Situação USPTO
Active USPTO registration
Tipo de processo
Pedido e registro
Eventos registrados
37
Atualização mais recente
12/05/2024
Classificação
Registrada
Tipo de marca
Verbal
Classes Nice
9, 41, 42
Data de depósito
22/06/2000
Data de registro
02/03/2004
Data de expiração
-
Ação recomendada
Execute uma análise de colidência completa e valide classes antes de qualquer protocolo ou investimento de marca.
Próximo passo
Esses são os detalhes do processo de registro. Mesmo assim, o monitoramento constante é o que garante tranquilidade de que o seu principal ativo continue protegido.
Dados completos do processo
Campos estruturados da autoridade responsável e do histórico oficial.
Data da situação
12/05/2024
Última transação
12/05/2024
Escritório responsável
United States Patent and Trademark Office
Código da situação
800
Cadastro oficial
Principal Register
Fundamento do pedido
Intent to use, Foreign priority
Código do desenho
1
Tipo de titular
03
Localização do titular
SINDELFINGEN, DE
Examinador
BUTLER, MIDGE
Unidade examinadora
L80
Localização atual
TMEG LAW OFFICE 108
Titulares e representantes
Titulares
HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
IMMOBILIENGESELLSCHAFT HELMUT FISCHER GMBH & CO. KG.
Helmut Fischer GmbH & Co. Institut fur Elektronik und Messtechnik
Representantes
Daniel S. Kriegsman, Esq. KRIEGSMAN & KRIEGSMAN
Classificação técnica
Classes Nice
Classe 9Classe 41Classe 42
Códigos Vienna
Sem códigos Vienna disponíveis.
Produtos e serviços
Classe 9
Scientificelectricalopticalmonitoring and measuring instrumentsinstruments for measuring the thickness of layers by electromagnetic radiationoptical instruments for measuring the diffractionrefractionabsorptionluminescencescatteringreflection phenomena for the determination of layer thicknesscoating thickness measurement instrumentselectrical conductivity measurement instrumentmicro hardness measuring instrumentsporosity measuring instrumentsinstruments for measuring thickness of coatingsalloy compositionmaterial analysisporosityelectrical conductivityferrite contentmicrohardnessother properties of coatings and layers; magneto-opto-electronic data recording mediablank magnetic computer tapes and floppy discs; electromagnetic radiation detectors; spectrometersX-ray fluorescence spectrometers; semiconductors detectorscolor video camerasX-ray detectors; X-ray tubes for scientific laboratory purposesdata processors; computers; computer software for use in controlling the scientificelectricalopticalmonitoring parameters of measuring instruments and to analysis and evaluatetransmit and process the results
Classe 41
Training in the use and operation of scientificelectrical and optical monitoring and measuring instrumentscomputers and software used therewith; providing online training via a global computer network in the use and operation of scientificelectrical and optical monitoring and measuring instruments and computers and software used therein
Classe 42
Product development for others; computer consultation for others; technical consultation in the field of scientificelectricalopticalmonitoring and measuring apparatuses and instruments and computers and software used therein; providing online consultation via a global computer network in the field of scientificelectricaloptical monitoring and measuring instruments and computers and software used therein; computer servicesdesigning and implementing web sites for others; Consulting and product development surfaces in the field of upgrading computers and software applicationsregarding transmission and reproduction of soundimagemagneto-opto-electronic datalayer thickness measuringx-ray fluorescencesemi-conductivityelectromagnetic radiation and statistical evaluation of data
Publicações
Histórico de despachos e eventos da marca no USPTO.
37 publicações encontradas
RNL2
REGISTERED AND RENEWED (SECOND RENEWAL - 10 YRS)
12/05/2024
9G8P
REGISTERED - SEC. 9 GRANTED/CHECK RECORD FOR SEC. 8
12/05/2024
8PRT
REGISTERED - PARTIAL SEC. 8 (10-YR) ACCEPTED
12/05/2024
APRE
CASE ASSIGNED TO POST REGISTRATION PARALEGAL
12/05/2024
E89R
TEAS SECTION 8 & 9 RECEIVED
25/01/2024
REM2
COURTESY REMINDER - SEC. 8 (10-YR)/SEC. 9 E-MAILED
02/03/2023
NA89
NOTICE OF ACCEPTANCE OF SEC. 8 & 9 - E-MAILED
22/03/2014
RNL1
REGISTERED AND RENEWED (FIRST RENEWAL - 10 YRS)
22/03/2014
89AG
REGISTERED - SEC. 8 (10-YR) ACCEPTED/SEC. 9 GRANTED
22/03/2014
APRE
CASE ASSIGNED TO POST REGISTRATION PARALEGAL
22/03/2014
89AF
REGISTERED - COMBINED SECTION 8 (10-YR) & SEC. 9 FILED
03/03/2014
E89R
TEAS SECTION 8 & 9 RECEIVED
03/03/2014
C15A
REGISTERED - SEC. 8 (6-YR) ACCEPTED & SEC. 15 ACK.
26/01/2010
APRE
CASE ASSIGNED TO POST REGISTRATION PARALEGAL
25/01/2010
E815
TEAS SECTION 8 & 15 RECEIVED
19/01/2010
ASGN
AUTOMATIC UPDATE OF ASSIGNMENT OF OWNERSHIP
29/07/2009
CFIT
CASE FILE IN TICRS
06/06/2007
R.PR
REGISTERED-PRINCIPAL REGISTER
02/03/2004
1.BD
Sec. 1(B) CLAIM DELETED
15/10/2003
IUCN
NOTICE OF ALLOWANCE CANCELLED
15/10/2003
FAXX
FAX RECEIVED
15/10/2003
NOAM
NOA MAILED - SOU REQUIRED FROM APPLICANT
15/04/2003
PUBO
PUBLISHED FOR OPPOSITION
21/01/2003
NPUB
NOTICE OF PUBLICATION
01/01/2003
CNSA
APPROVED FOR PUB - PRINCIPAL REGISTER
14/11/2002
DOCK
ASSIGNED TO EXAMINER
01/11/2002
CNSL
LETTER OF SUSPENSION MAILED
24/09/2002
ZZZX
PREVIOUS ALLOWANCE COUNT WITHDRAWN
18/09/2002
CNSA
APPROVED FOR PUB - PRINCIPAL REGISTER
10/06/2002
DOCK
ASSIGNED TO EXAMINER
21/05/2002
CRFA
CORRESPONDENCE RECEIVED IN LAW OFFICE
16/05/2002
PAPER RECEIVED
16/05/2002
CNSL
LETTER OF SUSPENSION MAILED
09/11/2001
CRFA
CORRESPONDENCE RECEIVED IN LAW OFFICE
09/07/2001
CNRT
NON-FINAL ACTION MAILED
02/02/2001
DOCK
ASSIGNED TO EXAMINER
19/01/2001
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